The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 25, 2008
Filed:
Feb. 16, 2006
Ronald Richard Breton, Richmond, VT (US);
S. Jay Chey, Ossining, NY (US);
Steven Alan Cordes, Yorktown Heights, NY (US);
Matthew Farinelli, Riverdale, NY (US);
Michael David Fregeau, Colchester, VT (US);
Sherif Ahmed Goma, White Plains, NY (US);
Gene T. Patrick, Richmond, VT (US);
Mohammed S. Shaikh, Essex Junction, VT (US);
Ronald Richard Breton, Richmond, VT (US);
S. Jay Chey, Ossining, NY (US);
Steven Alan Cordes, Yorktown Heights, NY (US);
Matthew Farinelli, Riverdale, NY (US);
Michael David Fregeau, Colchester, VT (US);
Sherif Ahmed Goma, White Plains, NY (US);
Gene T. Patrick, Richmond, VT (US);
Mohammed S. Shaikh, Essex Junction, VT (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
An apparatus for testing integrated circuit devices includes a probe device having a plurality of probes, a first substrate including a product substrate having a first surface and an array of electrical contacts disposed on the first surface thereof, and a second substrate disposed between the probes and the first substrate for electrically coupling the probes to corresponding electrical contacts disposed on the first surface of the product substrate.