Company Filing History:
Years Active: 2008
Title: Michael David Fregeau: Innovator in Probe Device Technology
Introduction
Michael David Fregeau is an accomplished inventor based in Colchester, Vermont. He has made significant contributions to the field of integrated circuit testing through his innovative designs and patents. His work primarily focuses on enhancing the efficiency and effectiveness of probe devices used in electronic testing.
Latest Patents
Fregeau holds a patent for a "Structure for coupling probes of probe device to corresponding electrical contacts on product substrate." This invention describes an apparatus for testing integrated circuit devices, which includes a probe device with multiple probes. The design features a first substrate that contains a product substrate with an array of electrical contacts on its surface. Additionally, a second substrate is positioned between the probes and the first substrate to facilitate electrical coupling to the corresponding contacts.
Career Highlights
Fregeau is associated with International Business Machines Corporation (IBM), where he has contributed to various projects and innovations in the technology sector. His expertise in probe device technology has positioned him as a valuable asset within the company.
Collaborations
Throughout his career, Fregeau has collaborated with notable colleagues, including Ronald Richard Breton and S Jay Chey. These partnerships have fostered a collaborative environment that encourages innovation and the sharing of ideas.
Conclusion
Michael David Fregeau's contributions to probe device technology exemplify his commitment to advancing electronic testing methods. His patent and work at IBM highlight his role as a key innovator in the field.