For the Inventor, By the Inventor

Enter inventor name

Katonah, NY, United States of America

Gary W Rubloff

USPTO Granted Patents = 15

Average Co-Inventor Count = 3.2

ph-index = 12

Forward Citations = 395(Granted Patents)

Location History:

Katonah, NY (US) (1987 - 1989)
Waccabuc, NY (US) (1988 - 1994)

Company Filing History:

15 out of 164,108

International Business Machines Corporation

Years Active: 1987-1994

Loading Chart...

15 patents (USPTO):Sort by Forward CitationsExplore Patents

1. 5290358 - Apparatus for directional low pressure chemical vapor deposition (DLPCVD) (1994-03-01),

2. 5284792 - Full-wafer processing of laser diodes with cleaved facets (1994-02-08),

3. 5155657 - High area capacitor formation using material dependent etching (1992-10-13),

4. 5153813 - High area capacitor formation using dry etching (1992-10-06),

5. 4886681 - Metal-polymer adhesion by low energy bombardment (1989-12-12),

6. 4845425 - Full chip integrated circuit tester (1989-07-04),

7. 4794863 - Motive structure for transporting workpieces (1989-01-03),

8. 4786864 - Photon assisted tunneling testing of passivated integrated circuits (1988-11-22),

9. 4784975 - Post-oxidation anneal of silicon dioxide (1988-11-15),

10. 4720401 - Enhanced adhesion between metals and polymers (1988-01-19),

11. 4706018 - Noncontact dynamic tester for integrated circuits (1987-11-10),

12. 4703260 - Full chip integrated circuit tester (1987-10-27),

13. 4692348 - Low temperature shallow doping technique (1987-09-08),

14. 4670710 - Noncontact full-line dynamic AC tester for integrated circuits (1987-06-02),

15. 4644264 - Photon assisted tunneling testing of passivated integrated circuits (1987-02-17),

This text is generated by artificial intelligence and may not be accurate.

Please report any incorrect information to support@idiyas.com

Loading…