Boise, ID, United States of America

Gary R Gilliam


Average Co-Inventor Count = 1.6

ph-index = 6

Forward Citations = 314(Granted Patents)


Company Filing History:


Years Active: 1994-2009

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21 patents (USPTO):Explore Patents

Title: Innovations of Gary R. Gilliam in Defect Testing Circuits

Introduction

Gary R. Gilliam, based in Boise, ID, is a prolific inventor with a remarkable portfolio of 21 patents. His work primarily focuses on advancements in on-chip circuit designs, particularly those used for defect testing in semiconductor technology. His innovative contributions have significantly improved the reliability and performance of electronic devices.

Latest Patents

One of Gary's latest innovations is the patent for an "On-chip Substrate Regulator Test Mode." This on-chip circuit is designed for defect testing, featuring the ability to maintain a substrate voltage at levels that can be more positive or negative than the typical negative operating voltage. The engineering behind this invention involves a chain of MOSFETs configured to function as resistive elements or diodes. Each element in the chain can drop a portion of the supply voltage, leading to an effective substrate voltage that corresponds to the overall supply voltage minus the drops across the diode chain.

A significant advantage provided by this technology is the charge pump that sustains the substrate voltage level set by the chain. It allows for thorough chip testing under various voltage conditions, facilitating the detection of devices that may fail only at cold temperatures or other margin failures resulting from ion contamination.

Career Highlights

Throughout his career, Gary R. Gilliam has made impactful contributions while working at notable companies such as Micron Technology Incorporated and Micron Semiconductor, Inc. His experiences in these organizations have played a pivotal role in shaping his innovations and understanding of semiconductor technology.

Collaborations

In his professional journey, Gary has collaborated with talented individuals in the field. Notable coworkers include Steve G. Renfro and Kacey Cutler, with whom he has shared insights and worked on innovative projects, reinforcing the importance of teamwork in advancing technology.

Conclusion

Gary R. Gilliam stands out as a leading innovator in defect testing circuits, with a strong emphasis on improving semiconductor reliability. His 21 patents, including the newly developed on-chip substrate regulator test mode, highlight his dedication to pushing the boundaries of technology. As he continues to advance his work, Gary's contributions are sure to lead to even more groundbreaking innovations in the electronics industry.

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