Manchester, MA, United States of America

Gary J Rosen

This inventor holds 1 USPTO granted patent and 2 published patent applications. Top assignee: Varian Semiconductor Equipment Associates, Inc.. Active years: 2015.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Gary J Rosen. Retrieved from https://idiyas.com/inventor/gary-j-rosen-b5oe9xvu

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 1 

% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 2015

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1 patent (USPTO):Explore Patents

Title: The Innovations of Gary J. Rosen

Introduction

Gary J. Rosen is an accomplished inventor based in Manchester, MA (US). He is known for his significant contributions to the field of measurement technology, particularly through his innovative patent related to eddy current thickness measurement.

Latest Patents

Rosen holds a patent for an "Eddy current thickness measurement apparatus." This invention involves a sheet of material that is placed in a melt of the same material. The sheet is formed using a cooling plate, and an exciting coil along with a sensing coil are positioned downstream of the cooling plate. These coils utilize eddy currents to accurately determine the thickness of the solid sheet resting on top of the melt.

Career Highlights

Gary J. Rosen has made notable strides in his career, working at Varian Semiconductor Equipment Associates, Inc. His expertise in measurement technology has positioned him as a valuable asset in the industry.

Collaborations

Rosen has collaborated with several talented individuals, including Frank Sinclair and Alexander Soskov. Their combined efforts have contributed to advancements in measurement technologies.

Conclusion

Gary J. Rosen's innovative work in eddy current thickness measurement showcases his dedication to advancing technology in his field. His contributions continue to influence the industry and inspire future innovations.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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