Gary A Winblad

Title: Innovations by Gary A. Winblad

Introduction

Gary A. Winblad is a notable inventor based in Dublin, California. He has made significant contributions to the field of semiconductor testing, particularly in the analysis of scan chains. With a total of 2 patents, Winblad's work has advanced the understanding and functionality of electronic testing processes.

Latest Patents

Winblad's latest patents include methods for analyzing scan chains and determining the numbers or locations of hold time faults in these chains. One of his innovative methods involves setting an environmental variable of the scan chain to a value believed to cause a hold time fault. A pattern is then shifted through the scan chain, allowing for the determination of possible hold time faults based on the timing of transitions at the output of the scan chain. This method not only identifies potential faults but also aids in localizing and ameliorating hold time defects.

Career Highlights

Gary A. Winblad has built a successful career at Verigy (Singapore) Pte. Ltd., where he has applied his expertise in semiconductor testing. His work has been instrumental in enhancing the reliability of electronic devices through improved testing methodologies. Winblad's innovative approaches have positioned him as a key figure in the industry.

Collaborations

Throughout his career, Winblad has collaborated with esteemed colleagues such as Stephen A. Cannon and Richard C. Dokken. These partnerships have fostered a collaborative environment that encourages innovation and the sharing of ideas.

Conclusion

In summary, Gary A. Winblad is a distinguished inventor whose contributions to semiconductor testing have had a lasting impact on the industry. His innovative methods for analyzing scan chains and addressing hold time faults demonstrate his commitment to advancing technology.