The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 14, 2010
Filed:
Oct. 31, 2007
Stephen A. Cannon, Fremont, CA (US);
Richard C. Dokken, San Ramon, CA (US);
Alfred L. Crouch, Cedar Park, TX (US);
Gary A. Winblad, Dublin, CA (US);
Stephen A. Cannon, Fremont, CA (US);
Richard C. Dokken, San Ramon, CA (US);
Alfred L. Crouch, Cedar Park, TX (US);
Gary A. Winblad, Dublin, CA (US);
Verigy (Singapore) Pte. Ltd., Singapore, SG;
Abstract
A method for determining that failures in semiconductor test are due to a defect potentially causing a hold time violation in a scan cell in a scan chain, counting the number of potential defects, and, if possible, localizing, and ameliorating hold time defects in a scan chain.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile