Tokorozawa, Japan

Fumio Mizuno


Average Co-Inventor Count = 3.0

ph-index = 16

Forward Citations = 671(Granted Patents)


Location History:

  • Kodaira, JP (1978)
  • Saitama, JP (1995)
  • Tokyo, JP (1995 - 1999)
  • Tokorozawa, JP (1995 - 2010)
  • Tokorozaw, JP (2012)

Company Filing History:


Years Active: 1978-2012

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33 patents (USPTO):Explore Patents

Title: Fumio Mizuno: Innovator in Microstructured Pattern Inspection

Introduction

Fumio Mizuno, based in Tokorozawa, Japan, is a prominent inventor known for his significant contributions to the field of microstructured patterns in semiconductor manufacturing. With a remarkable portfolio of 33 patents, Mizuno’s work focuses on advancing inspection methods that enhance the efficiency and accuracy of pattern detection in photoresist materials.

Latest Patents

Fumio Mizuno's latest innovation, a microstructured pattern inspection method, demonstrates his expertise in detecting and analyzing the edges of reticles in relation to the microstructured patterns exposed by steppers. This method involves evaluating the shapes of these patterns both at the surface and at the bottom of the photoresist. By calculating and displaying dislocation vectors that illustrate the positional relationships between detected patterns, Mizuno's invention allows for comprehensive analysis of multiple positions on a wafer. This capability not only categorizes the sizes and distribution of dislocation vectors but also helps in predicting potential abnormalities in steppers or wafers.

Career Highlights

Throughout his career, Fumio Mizuno has worked with respected companies such as Hitachi, Ltd. and Hitachi VLSI Engineering Corporation. His contributions in these organizations have played a critical role in advancing semiconductor technologies and inspection methodologies.

Collaborations

Mizuno has collaborated with notable professionals including Hideo Todokoro and Fumihiro Sasajima. These partnerships have further enriched his inventions and have been influential in the continued development of innovative inspection techniques within the industry.

Conclusion

Fumio Mizuno's impactful work in the field of microstructured patterns and his extensive patent portfolio highlight his role as a leader in semiconductor innovation. His latest inventions not only showcase technical ingenuity but also reflect a commitment to enhancing the precision and reliability of manufacturing processes in the technology sector. As the industry evolves, Mizuno's contributions will undoubtedly continue to influence future advancements.

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