San Luis Obispo, CA, United States of America

Frederic Anthony Schraub


Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 4(Granted Patents)


Company Filing History:


Years Active: 2013

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1 patent (USPTO):Explore Patents

Title: The Innovations of Frederic Anthony Schraub

Introduction

Frederic Anthony Schraub is an accomplished inventor based in San Luis Obispo, California. He has made significant contributions to the field of technology, particularly in the area of wafer processing. His innovative ideas have led to the development of a patented system that enhances the efficiency of wafer monitoring.

Latest Patents

Frederic Schraub holds a patent for a "System and method for in situ monitoring of top wafer thickness in a stack of wafers." This invention provides a system for holding non-contact wafer probes over the surface of a wafer. It includes a mechanism for flushing the surface of the probe during the grinding process, which improves the accuracy and reliability of wafer thickness measurements.

Career Highlights

Frederic is currently employed at Strasbaugh, a company known for its advanced semiconductor manufacturing equipment. His work at Strasbaugh has allowed him to apply his innovative ideas in a practical setting, contributing to the advancement of wafer processing technologies.

Collaborations

Frederic has collaborated with notable colleagues, including Michael R. Vogtmann and Benjamin C. Smedley. These partnerships have fostered a creative environment that encourages the exchange of ideas and the development of cutting-edge technologies.

Conclusion

Frederic Anthony Schraub's contributions to the field of wafer processing exemplify the impact of innovation in technology. His patented system not only enhances the efficiency of wafer monitoring but also showcases his dedication to advancing semiconductor manufacturing.

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