Queen Creek, AZ, United States of America

Frank Evans

This inventor holds 1 USPTO granted patent. Top assignee: Intel Corporation. Active years: 2016.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Frank Evans. Retrieved from https://idiyas.com/inventor/frank-evans-i0tg3bau

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 5.0

ph-index = 1


Company Filing History:


Years Active: 2016

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1 patent (USPTO):Explore Patents

Title: Frank Evans - Innovator in Laser Marking Technology

Introduction

Frank Evans is a notable inventor based in Queen Creek, AZ (US). He has made significant contributions to the field of laser marking technology. With a focus on creating efficient methods for marking surfaces, his work has implications in various industries.

Latest Patents

Frank Evans holds 1 patent for his innovative invention titled "Die or substrate marking using a laser." This patent describes apparatuses, systems, and methods that generate markings on the surface of a die or substrate. The markings represent crucial information and can be annealed onto the surface using a laser. Additionally, an embodiment of the invention utilizes an out-of-focus laser beam to mark a solder resist material.

Career Highlights

Frank is currently employed at Intel Corporation, where he applies his expertise in laser technology. His work at Intel has allowed him to be at the forefront of technological advancements in the semiconductor industry.

Collaborations

Throughout his career, Frank has collaborated with talented individuals such as Shipeng Qiu and Dhruv P Bhate. These collaborations have further enhanced the innovative capabilities within his projects.

Conclusion

Frank Evans is a distinguished inventor whose work in laser marking technology has paved the way for advancements in the field. His contributions continue to influence the industry and inspire future innovations.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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