Company Filing History:
Years Active: 1976-1981
Title: Frank A. Slaker: Innovator in Laser Scanning Technology
Introduction
Frank A. Slaker is a notable inventor based in Norwalk, Connecticut, recognized for his contributions to laser scanning technology. With a total of three patents to his name, Slaker has made significant advancements in the field of inspection systems.
Latest Patents
One of his latest patents is the "Multiple Source Laser Scanning Inspection System." This innovative system allows for the simultaneous scanning of multiple laser sources across a moving web of material. By utilizing a common scanning apparatus, it collects laser beam radiation from the material being inspected, generating signals that indicate the integrity of the radiation. The flexibility in size, positioning, and wavelength of the laser sources enables the detection of various types of flaws that would be undetectable with a single source system.
Another significant patent is the "Method and Apparatus for a Web Edge Tracking Flaw Detection System." This system scans a moving web of material using a light source, such as a laser beam, to detect changes in light intensity. It provides indications for discerning flaws in the web, utilizing a digital signal to control a voltage-controlled oscillator. This technology ensures continuous functionality even in the event of a web break, enhancing the reliability of the inspection process.
Career Highlights
Frank A. Slaker is currently employed at Intec Inc., where he continues to develop innovative solutions in laser scanning technology. His work has significantly impacted the efficiency and accuracy of material inspection processes.
Collaborations
Slaker collaborates with Monty M. Merlen, contributing to the advancement of their shared projects and innovations in the field.
Conclusion
Frank A. Slaker's contributions to laser scanning technology through his patents and work at Intec Inc. highlight his role as a key innovator in the industry. His advancements continue to shape the future of inspection systems.
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