The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 05, 1981
Filed:
Jul. 27, 1979
Frank A Slaker, Norwalk, CT (US);
Intec Corporation, Trumbull, CT (US);
Abstract
A laser scanning flaw direction inspection system is provided for simultaneously scanning a plurality of laser sources across a moving web of material being inspected. The plurality of laser beams are simultaneously scanned utilizing a common scanning apparatus. Laser beam radiation from the plurality of laser sources is collected from the web of material being inspected and detected for generating signals based on the integrity of the radiation applied to the detector from the material being inspected. The plurality of laser sources are preferably of different wave lengths, may have different spot sizes and may be separated by a fixed distance in either the scanned direction or in the direction of web travel. By providing such flexibility in size, positioning and wavelength, and using optical filters to separate the signals related to each of the sources, different types of flaws as well as different information may be generated which would not be possible using a single source system.