The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 14, 1976
Filed:
May. 16, 1975
Frank A Slaker, Norwalk, CT (US);
Intec Corporation, Norwalk, CT (US);
Abstract
A rotary scan flaw detection system is provided in which a record medium is driven synchronously with the scanning of a source of radiation across the surface of material being examined for flaws. A method and apparatus are provided for dividing the material into discrete segments or strips so that flaw information obtained from scanning the material may be sorted and routed pursuant to a predetermined plan. A grating is scanned having predetermined marks thereon which are recorded on the record medium. The material is then scanned, the marks played back, and fed to a data routing logic circuitry along with the flaw information derived from the surface of the material being examined, so that the flaw information is automatically routed in accordance with the occurrence of flaws on discrete segments of the material.