This inventor holds 2 USPTO granted patents and 5 published patent applications. Top assignee: Tokyo Electron Limited. Active years: 2026.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2026
Title: Francisco Machuca: Innovator in Hybrid Metrology
Introduction
Francisco Machuca is a notable inventor based in Fremont, California. He has made significant contributions to the field of metrology through his innovative approaches. His work primarily focuses on the integration of optical and X-ray technologies for enhanced device characterization.
Latest Patents
Machuca holds a patent for a method titled "Hybrid X-ray and optical metrology and navigation." This invention involves characterizing a device under test (DUT) by illuminating it with both a broadband optical beam and an X-ray beam. The method allows for concurrent acquisition of X-ray metrology information and optical images, utilizing various modalities such as absorption and fluorescence. This innovative approach is particularly useful for analyzing electronic devices and substrates.
Career Highlights
Francisco Machuca is currently employed at Tokyo Electron Limited, where he continues to develop cutting-edge technologies. His expertise in metrology has positioned him as a key player in advancing the capabilities of device characterization.
Collaborations
Machuca collaborates with Vi Vuong, contributing to the innovative projects at Tokyo Electron Limited. Their combined efforts enhance the research and development initiatives within the company.
Conclusion
Francisco Machuca's contributions to hybrid metrology exemplify the intersection of optical and X-ray technologies. His innovative patent and ongoing work at Tokyo Electron Limited highlight his commitment to advancing the field.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile