Enschede, Netherlands

Floris Broekema

This inventor holds 1 USPTO granted patent and 1 EPO patent. Top assignee: Fluke Precision Measurement Limited. Active years: 2019.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Floris Broekema. Retrieved from https://idiyas.com/inventor/floris-broekema

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

 

Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 2(Granted Patents)


Company Filing History:


Years Active: 2019

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1 patent (USPTO):Explore Patents

Title: Innovations by Floris Broekema

Introduction

Floris Broekema is a notable inventor based in Enschede, Netherlands. He has made significant contributions to the field of signal processing through his innovative patent. His work focuses on enhancing the accuracy and efficiency of signal waveform classification.

Latest Patents

Floris Broekema holds a patent for a "Method and apparatus for classifying a signal waveform under test." This invention involves acquiring waveform data indicative of the signal waveform under test, analyzing the waveform data, determining a signal waveform type from the analyzed data, and activating an appropriate numerical measurement based on the determined signal waveform type. Additionally, the patent includes a test and measurement instrument designed to implement the disclosed methods effectively.

Career Highlights

Floris is currently employed at Fluke Precision Measurement Limited, where he applies his expertise in signal processing. His work at Fluke has allowed him to develop practical solutions that benefit various industries reliant on precise measurements.

Collaborations

Floris collaborates with Peter Deverson, contributing to advancements in measurement technology. Their combined efforts aim to push the boundaries of innovation in their field.

Conclusion

Floris Broekema's contributions to signal processing through his patent demonstrate his commitment to innovation and excellence in technology. His work continues to influence the industry positively.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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