The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 13, 2019
Filed:
May. 17, 2016
Applicant:
Fluke Precision Measurement Limited, Norwich, GB;
Inventors:
Peter Deverson, Almelo, NL;
Floris Broekema, Enschede, NL;
Assignee:
Fluke Precision Measurement Limited, Norwich, GB;
Primary Examiner:
Int. Cl.
CPC ...
G01R 13/02 (2006.01);
U.S. Cl.
CPC ...
G01R 13/029 (2013.01); G01R 13/0254 (2013.01);
Abstract
A method of classifying a signal waveform under test for appropriate numerical measurement includes acquiring waveform data indicative of the signal waveform under test, analyzing the waveform data, determining a signal waveform type from the analyzed waveform data, and activating an appropriate numerical measurement of the signal waveform under test based upon the determined signal waveform type. There is also provided a test and measurement instrument configured to carry out any of the disclosed methods.