Norwich, United Kingdom

Fluke Precision Measurement Limited

Calculating rank
USPTO Granted Patents = 13


Trademarks = 4

Forward Citations = 33

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13 inventors (with patents filed for the assignee):

goldMedal Wei Huang (4 out of 75 patents)

silverMedal Yurui Shen (3 out of 12 patents)

bronzeMedal Yong Yang (2 out of 45 patents)

4.  Hong Yao (2 out of 6 patents)

5.  Gerardus Hermanus Bernardus Grashof (1 out of 1 patent)

6.  Steven L Cheek (1 out of 1 patent)

7.  Peter Deverson (1 out of 1 patent)

8.  Floris Broekema (1 out of 1 patent)

9.  Hua Qui (1 out of 1 patent)

10.  Philip James Harbord (1 out of 1 patent)

11.  Alastair Fields (1 out of 1 patent)

12.  Simon Timothy Hollingworth (1 out of 1 patent)

13.  Chao B Zhang (1 out of 35 patents)

14.  Fei Yang (117 patents)

15.  Chao Zhang (16 patents)


13 patents:

Company Overview
Fluke Precision Measurement Limited, based in Norwich, specializes in precision measurement and testing equipment. The company is renowned for its innovative solutions in electrical, thermal, and industrial measurement technologies. Fluke's products are widely utilized across various sectors, including manufacturing, telecommunications, and healthcare, ensuring accuracy and reliability in critical measurements. With a commitment to quality and performance, Fluke continues to advance measurement technology, supporting professionals in achieving optimal results in their fields.
Profile summary synthesized from public USPTO records and patent filings.

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USPTO Data Jan 1 1976 - Oct 27 2026

13 Patents

#6 in Norwich

#1,367 in United Kingdom

#45,085 in the World

Norwich, GB
Norwich, United Kingdom
Forward Citations = 33

13 inventors:

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Fluke Precision Measurement Limited. Retrieved from https://idiyas.com/company/fluke-precision-measurement

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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