San Jose, CA, United States of America

Felix Gutman

This inventor holds 1 USPTO granted patent. Top assignee: Acm Research, Inc.. Active years: 2004.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Felix Gutman. Retrieved from https://idiyas.com/inventor/felix-gutman

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 71(Granted Patents)


Company Filing History:


Years Active: 2004

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1 patent (USPTO):Explore Patents

Title: Felix Gutman: Innovator in Semiconductor Processing

Introduction

Felix Gutman is a notable inventor based in San Jose, California. He has made significant contributions to the field of semiconductor processing, particularly in the area of electropolishing and electroplating.

Latest Patents

Felix Gutman holds a patent for "Methods and apparatus for holding and positioning semiconductor workpieces during electropolishing and/or electroplating of the workpieces." This invention features a wafer chuck assembly designed to hold a wafer during the electroplating and electropolishing processes. The assembly includes a wafer chuck that receives the wafer and an actuator assembly that moves the wafer chuck between an open and closed position.

Career Highlights

Felix is currently employed at Acm Research, Inc., where he continues to innovate in semiconductor technologies. His work has been instrumental in advancing methods that enhance the efficiency and effectiveness of semiconductor manufacturing.

Collaborations

Felix has collaborated with talented individuals such as Hui Wang and Voha Nuch, contributing to a dynamic work environment that fosters innovation.

Conclusion

Felix Gutman's contributions to semiconductor processing through his innovative patent and collaborative efforts highlight his role as a key figure in the industry. His work continues to influence advancements in technology and manufacturing processes.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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