This inventor holds 1 USPTO granted patent. Top assignee: Applied Materials Israel Limited. Active years: 2019.
Company Filing History:
Years Active: 2019
Title: Eyal Bassa: Innovator in Defect Detection Technology
Introduction
Eyal Bassa is a notable inventor based in Matan, Israel. He has made significant contributions to the field of defect detection technology, particularly through his innovative patent. His work focuses on improving the accuracy and efficiency of identifying defects in printed specimens.
Latest Patents
Eyal Bassa holds a patent for a "Method of detecting repeating defects and system thereof." This patent outlines a system and method for detecting repeating defects on a specimen that has been printed with multiple mask fields. The method involves scanning the specimen to capture images from dies located at the same position in the mask fields. It further includes generating an average image to determine the presence of defects based on a predefined threshold.
Career Highlights
Eyal Bassa is currently employed at Applied Materials Israel Limited, where he applies his expertise in defect detection technology. His innovative approach has led to advancements in the field, enhancing the quality control processes in manufacturing.
Collaborations
Eyal collaborates with talented professionals such as Karen Pomeranz and Eyal Neistein. Their combined efforts contribute to the development of cutting-edge technologies in their field.
Conclusion
Eyal Bassa's contributions to defect detection technology exemplify the impact of innovation in manufacturing processes. His patent and work at Applied Materials Israel Limited highlight his role as a key figure in advancing this important area of technology.