Ernest Allen, Iii

Title: The Innovations of Ernest Allen, III

Introduction

Ernest Allen, III is a notable inventor based in Hillsboro, OR (US), recognized for his contributions to integrated circuit testing. With a total of 8 patents to his name, Allen has made significant advancements in the field of electronics.

Latest Patents

Among his latest patents is a method for testing integrated circuits at multiple voltages. This method involves measuring the quiescent current of an integrated circuit at two different voltages. By determining the functional relationship between these current measurements and comparing them against a predetermined functional relationship, it is possible to identify defects within the integrated circuit. Another notable patent focuses on VDD over and undervoltage measurement techniques using monitor cells. This method includes coupling a reference voltage to comparators integrated on the chip, allowing for the comparison of supply voltage to the reference voltage. The results of this comparison are crucial for determining overvoltage or undervoltage conditions, which can inform the design of decoupling circuits.

Career Highlights

Throughout his career, Allen has worked with prominent companies such as LSI Logic Corporation and Altera Corporation. His experience in these organizations has contributed to his expertise in integrated circuit design and testing.

Collaborations

Some of his notable coworkers include David A. Castaneda and Miaw Looi, who have collaborated with him on various projects throughout his career.

Conclusion

Ernest Allen, III's innovative work in integrated circuit testing has led to significant advancements in the field. His patents reflect a deep understanding of electronic design and testing methodologies, making him a valuable contributor to the industry.