Erik N Johnson

Title: **Innovations of Erik N Johnson: Pioneering Patent Holder in Semiconductor Inspection Technologies**

Introduction

Erik N Johnson, based in Santa Clara, California, is a notable inventor recognized for his significant contributions to the field of semiconductor inspection technology. With a total of four patents to his name, Johnson has developed innovative methods and apparatuses that enhance the efficiency and accuracy of defect detection in semiconductor manufacturing processes.

Latest Patents

Among Erik N Johnson's latest patents are two pivotal inventions that leverage advanced processing techniques. The first patent, titled "Method and apparatus for inspecting reticles implementing parallel processing," discloses an apparatus for analyzing image portions of a sample region. This groundbreaking apparatus incorporates a multitude of processors designed to analyze these image portions in parallel, thereby improving the speed and effectiveness of inspections. The apparatus is equipped with a data distribution system that efficiently channels image data to the designated processors, enabling precise image analysis.

The second patent, "Defect detection using multiple sensors and parallel processing," describes innovative techniques for identifying defects on semiconductor wafers. This invention utilizes a parallel processing system where interconnected data distribution nodes facilitate a seamless flow of data from multiple detectors to a variety of processing nodes. This configuration allows the implementation of diverse defect analysis algorithms, ensuring comprehensive inspections of semiconductor wafers.

Career Highlights

Throughout his career, Erik N Johnson has made impactful strides in semiconductor technology, primarily through his roles at institutions such as KLA-Tencor Corporation and KLA-Tencor Technologies Corporation. His work in these organizations has been instrumental in shaping the technological advancements in the semiconductor industry.

Collaborations

Johnson has collaborated with notable professionals, including Edward M Goldberg and Lawrence Robert Miller. These collaborations have fostered an environment of innovation and have contributed to the successful development of cutting-edge inspection technologies in semiconductors.

Conclusion

Erik N Johnson exemplifies the innovative spirit of modern inventors. His contributions have paved the way for improved methodologies in semiconductor inspection, reflecting a commitment to advancing technology in this crucial sector. With a strong portfolio of patents, Johnson continues to influence the industry and inspire future innovations.