Nuenen, Netherlands

Erik Franken

USPTO Granted Patents = 1 

 

Average Co-Inventor Count = 4.0

ph-index = 1


Company Filing History:


Years Active: 2025

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1 patent (USPTO):Explore Patents

Title: The Innovative Mind of Erik Franken

Introduction

Erik Franken is a notable inventor based in Nuenen, Netherlands. He has made significant contributions to the field of particle beam technology, particularly through his innovative patent. His work focuses on enhancing the quality and efficiency of imaging processes, which is crucial in various scientific applications.

Latest Patents

Erik Franken holds a patent for an invention titled "Automatic Particle Beam Focusing." This patent presents various approaches for automatically focusing particle beams for Scanning Probe Analysis (SPA). One of the key methods described involves determining a focus adjustment for a specific region of a sample to achieve a targeted defocus. This is based on at least one defocus measurement from neighboring regions of the sample. By acquiring an image of the sample at the adjusted focus, the invention allows for a targeted defocus across different regions, resulting in improved and uniform image quality. This innovation reduces the need for auxiliary imaging, thereby increasing processing throughput and efficiency.

Career Highlights

Erik Franken is associated with FEI Company, where he applies his expertise in particle beam technology. His work at FEI Company has positioned him as a valuable contributor to advancements in imaging techniques. With a focus on innovation, he continues to push the boundaries of what is possible in his field.

Collaborations

Erik has collaborated with talented individuals such as Yuchen Deng and Bart Van Knippenberg. These collaborations have fostered a creative environment that encourages the exchange of ideas and the development of groundbreaking technologies.

Conclusion

Erik Franken's contributions to the field of particle beam technology exemplify the spirit of innovation. His patent for automatic particle beam focusing not only enhances image quality but also improves processing efficiency. Through his work at FEI Company and collaborations with other experts, he continues to make a significant impact in the realm of scientific imaging.

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