This inventor holds 2 USPTO granted patents. Top assignee: Analogic Corporation. Active years: 2006-2015.
Location History:
- Newton, MA (US) (2006)
- Newton, NH (US) (2015)
Company Filing History:
Years Active: 2006-2015
Title: Innovations by Eric N Finck in Radiation Inspection Technologies
Introduction
Eric N Finck is a notable inventor based in Newton, MA, who has made significant contributions to the field of radiation inspection technologies. With a total of 2 patents, his work focuses on enhancing the safety and efficiency of X-ray inspection systems.
Latest Patents
One of Finck's latest patents is titled "Mitigation of radiation leakage via entry port and/or exit port of radiation system." This invention provides an object scanner, such as an X-ray system, designed to translate an object undergoing examination along a non-linear path. The examination region is spatially offset relative to the entry and exit ports, minimizing the line of sight through the scanner. This configuration reduces the possibility of radiation escaping the examination region. Another significant patent is "X-ray inspection systems with improved radiation attenuation shielding." This patent describes an X-ray inspection system that includes a shielded housing with a tunnel passageway and entrance and exit ports. The system features a detection system for generating images of articles located in the inspection station, along with a conveyor assembly and flexible X-ray attenuating hanging strips distributed within the shielded housing.
Career Highlights
Eric N Finck is currently employed at Analogic Corporation, where he continues to innovate in the field of radiation inspection technologies. His work has contributed to advancements in safety measures and efficiency in X-ray systems.
Collaborations
Throughout his career, Finck has collaborated with notable colleagues, including David A Schafer and Douglas Q Abraham. These collaborations have further enhanced the development of innovative technologies in their field.
Conclusion
Eric N Finck's contributions to radiation inspection technologies through his patents demonstrate his commitment to improving safety and efficiency in X-ray systems. His work at Analogic Corporation and collaborations with esteemed colleagues highlight his significant impact in this area.