The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 19, 2006
Filed:
Sep. 12, 2005
Douglas Q. Abraham, Topsfield, MA (US);
Eric N. Finck, Newton, MA (US);
David Schafer, Rowley, MA (US);
Douglas Q. Abraham, Topsfield, MA (US);
Eric N. Finck, Newton, MA (US);
David Schafer, Rowley, MA (US);
Analogic Corporation, Peabody, MA (US);
Abstract
Arrangements of X-ray inspection systems are described. An X-ray inspection system may include a shielded housing with a tunnel passageway and entrance and exit ports. The system may include an X-ray inspection station defining a rectilinear coordinate system, an X-ray source, and a detection system for generating images of articles that are located in the inspection station. A conveyor assembly may be included. A plurality of flexible X-ray attenuating, spaced-apart, hanging strips may be distributed within the shielded housing between the ports and across the entire tunnel passageway. The X-ray inspection system may include at least one curtain of flexible X-ray attenuating hanging strips. Each curtain may include a plurality of sets of contiguous strips, the strips of each set being of equal length and distributed across the tunnel passageway. The strips of at least one set are shorter than the strips of at least one other set.