The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 17, 2015
Filed:
Jun. 25, 2013
Analogic Corporation, Peabody, MA (US);
David Schafer, Rowley, MA (US);
Eric Finck, Newton, NH (US);
Analogic Corporation, Peabody, MA (US);
Abstract
Among other things, an object scanner, such as an x-ray system, is provided, where the object scanner is configured to translate an object undergoing an examination along a non-linear path. For example, in some embodiments, an examination region of the object scanner is spatially offset, relative to an entry port and/or an exit port of the object scanner, such that there is little to no line of sight through the object scanner, from the entry port to the exit port. The non-linearity of the path is configured to reduce the possibility of radiation scatted by an object and/or by portions of the object scanner from escaping the examination region and exiting the object scanner via the entry port and/or the exit port.