Yavne, Israel

Erez Lidor

This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: Applied Materials Israel Limited. Active years: 2024.

USPTO Granted Patents = 1 

% Patents Active = 100.0

Average Co-Inventor Count = 8.0

ph-index = 1


Company Filing History:


Years Active: 2024

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1 patent (USPTO):Explore Patents

Title: Erez Lidor: Innovator in Semiconductor Examination Technology

Introduction

Erez Lidor is a notable inventor based in Yavne, Israel. He has made significant contributions to the field of semiconductor technology, particularly in the examination of semiconductor specimens. His innovative approach has led to the development of a unique patent that enhances the efficiency and accuracy of semiconductor analysis.

Latest Patents

Erez Lidor holds a patent for "Image generation for examination of a semiconductor specimen." This patent describes a system and method for examining a semiconductor specimen by obtaining a sequence of frames from an electron beam tool. The method involves scanning the area from multiple directions, registering the frames, and generating a composite image of the specimen. This innovative technique allows for a more comprehensive analysis of semiconductor materials.

Career Highlights

Erez Lidor is currently employed at Applied Materials Israel Limited, where he applies his expertise in semiconductor technology. His work focuses on advancing the methods used in semiconductor examination, contributing to the overall improvement of the industry. With a patent to his name, he has established himself as a key player in this specialized field.

Collaborations

Erez collaborates with talented professionals such as Oz Fox-Kahana and Murad Muslimany. Their combined efforts contribute to the innovative projects at Applied Materials Israel Limited, fostering a collaborative environment that encourages technological advancements.

Conclusion

Erez Lidor's contributions to semiconductor examination technology exemplify the impact of innovation in the field. His patent and work at Applied Materials Israel Limited highlight his commitment to advancing semiconductor analysis methods.

Profile summary based on public USPTO records.
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