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For the Inventor, By the Inventor

Boise, ID, United States of America

Elton J Hochhalter

This inventor holds 6 USPTO granted patents. Top assignee: Micron Technology Incorporated. Active years: 2001-2006.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Elton J Hochhalter. Retrieved from https://idiyas.com/inventor/elton-j-hochhalter

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 6

% Patents Active = 50.0

Average Co-Inventor Count = 4.0

ph-index = 3

Forward Citations = 38(Granted Patents)


Company Filing History:

goldMedal6 out of 39,222 
 
Micron Technology Incorporated
 patents

Years Active: 2001-2006

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6 patents (USPTO):Explore Patents
1. 7102737 - Method and apparatus for automated, in situ material detection using filtered fluoresced, reflected, or absorbed light (2006-09-05),
2. 6831734 - Method and apparatus for automated, in situ material detection using filtered fluoresced, reflected, or absorbed light (2004-12-14),
3. 6704107 - Method and apparatus for automated, in situ material detection using filtered fluoresced, reflected, or absorbed light (2004-03-09),
4. 6369887 - Method and apparatus for automated, in situ material detection using filtered fluoresced, reflected, or absorbed light (2002-04-09),
5. 6328803 - Method and apparatus for controlling rate of pressure change in a vacuum process chamber (2001-12-11),
6. 6256094 - Method and apparatus for automated, in situ material detection using filtered fluoresced, reflected, or absorbed light (2001-07-03),

Title: The Innovative Contributions of Elton J Hochhalter

Introduction

Elton J Hochhalter is a notable inventor based in Boise, ID (US). He has made significant contributions to the field of material detection, particularly in the semiconductor industry. With a total of 6 patents to his name, Hochhalter's work has advanced the capabilities of automated detection systems.

Latest Patents

One of Hochhalter's latest patents is a method and apparatus for automated, in situ material detection using filtered fluoresced, reflected, or absorbed light. This innovative method involves projecting a narrow beam of light onto a sample surface to detect specific materials, such as photo-resist material. The fluoresced and/or reflected light intensity is measured by a light detector, which converts the intensity into a numerical value. This value is then transmitted to a logic circuit that determines the appropriate disposition of the sample. The logic circuit also controls a robotic device that handles the samples, making the process efficient and effective for semiconductor wafer testing.

Career Highlights

Hochhalter's career is marked by his dedication to advancing technology in material detection. His work at Micron Technology Incorporated has positioned him as a key player in the development of innovative solutions for the semiconductor industry. His patents reflect a commitment to improving the accuracy and efficiency of material detection processes.

Collaborations

Throughout his career, Hochhalter has collaborated with talented individuals such as Joe Lee Phillips and David R Johnson. These partnerships have contributed to the successful development of his patented technologies.

Conclusion

Elton J Hochhalter's contributions to the field of material detection are significant and impactful. His innovative patents and work at Micron Technology Incorporated demonstrate his commitment to advancing technology in the semiconductor industry. His achievements continue to influence the future of automated detection systems.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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