Ellen R Laird

Title: Innovations of Ellen R Laird

Introduction

Ellen R Laird is a notable inventor based in San Jose, California. She has made significant contributions to the field of dimensional calibration standards, holding a total of six patents. Her work has advanced the accuracy and reliability of measurement systems.

Latest Patents

One of her latest patents involves a calibration standard designed for calibrating lateral or angular dimensional measurement systems. This innovative standard includes a first substrate spaced from a second substrate. The standard can be cross-sectioned in a direction that is either substantially perpendicular or non-perpendicular to the upper surface of the first substrate. The cross-sectioned portion forms a viewing surface of the calibration standard. Additionally, the standard may include at least one layer disposed between the first and second substrates. Features etched into the substrates or the layer may have a traceably measured thickness or be oriented at a traceably measured angle with respect to the viewing surface. These features can be measured using techniques that calibrate a measurement system with a standard reference material traceable to a national testing authority.

Career Highlights

Ellen has worked with prominent companies in the industry, including VLSI Standards, Inc. and KLA-Tencor Corporation. Her experience in these organizations has contributed to her expertise in the field of calibration standards.

Collaborations

Throughout her career, Ellen has collaborated with notable colleagues such as Bradley W Scheer and Marco Tortonese. These partnerships have further enriched her work and innovations.

Conclusion

Ellen R Laird's contributions to dimensional calibration standards exemplify her dedication to innovation in measurement technology. Her patents reflect her expertise and commitment to advancing the field.