Hitachinaka, Japan

Eiichi Seya

This inventor holds 3 USPTO granted patents. Top assignee: Hitachi-High-Technologies Corporation. Active years: 2005-2010.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Eiichi Seya. Retrieved from https://idiyas.com/inventor/eiichi-seya-99lvjetn

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 33.3

Average Co-Inventor Count = 2.4

ph-index = 2

Forward Citations = 11(Granted Patents)


Company Filing History:


Years Active: 2005-2010

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3 patents (USPTO):Explore Patents

Title: Eiichi Seya: Innovator in Electron Microscopy

Introduction

Eiichi Seya is a prominent inventor based in Hitachinaka, Japan. He has made significant contributions to the field of electron microscopy, holding a total of 3 patents. His work focuses on enhancing the precision and efficiency of electron microscopes, which are essential tools in various scientific and industrial applications.

Latest Patents

Seya's latest patents include a stage mechanism, an electron microscope featuring this stage mechanism, and a method for controlling the positioning of the stage mechanism. The stage mechanism is designed to perform high-accuracy positioning while minimizing vibration and drift. It utilizes an ultrasonic motor in its drive mechanism, combined with a fixing mechanism that increases stop stiffness. This innovative structure incorporates a piezoelectric actuator mounted in a pre-load mechanism alongside the ultrasonic motor. When the stage is fixed by the mechanism after positioning, the piezoelectric actuators extend to press the stage, ensuring stability.

Another notable patent is for a scanning electron microscope capable of speedy focusing. This device automatically measures the electrostatic voltage of a wafer's surface within the specimen chamber. It does so in an accurate and efficient manner, accommodating different electrostatic voltages inside and outside the chamber. The microscope controls its optical systems by measuring the electrostatic voltage based on the capacitance between divided parts of an electrode plate, which is used to apply a retarding voltage over the specimen.

Career Highlights

Eiichi Seya is associated with Hitachi High-Technologies Corporation, where he has been instrumental in advancing electron microscopy technology. His innovative designs and patents have significantly improved the functionality and performance of electron microscopes.

Collaborations

Seya has collaborated with notable colleagues, including Takashi Nagamatsu and Shuichi Nakagawa. Their combined expertise has contributed to the development of cutting-edge technologies in the field.

Conclusion

Eiichi Seya's contributions to electron microscopy through his innovative patents and collaborations highlight his role as a key figure in advancing scientific instrumentation. His work continues to influence the field and enhance the capabilities of electron microscopes.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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