Company Filing History:
Years Active: 2019-2025
Title: Edward J Damron: Innovator in Non-Contact Sensor Technology
Introduction
Edward J Damron is a notable inventor based in Waynesville, OH (US). He has made significant contributions to the field of metrology through his innovative patents. With a total of 3 patents, Damron has focused on enhancing the efficiency and accuracy of measurement systems.
Latest Patents
One of his latest patents is for an automated non-contact sensor positioning system. This multi-axis system is designed for positioning a workpiece measuring sensor on a metrology machine. The system allows for movement along and/or about at least linear directions/axes (X, Z, A, B), enabling automatic control of the sensor's linear and/or rotational movement to a predetermined position without operator intervention. This innovation significantly reduces setup times when changing workpieces or tooling on a machine.
Another notable patent involves the measurement of toothed articles on a composite machine tester platform utilizing a non-contact sensor. This method and machine incorporate at least one non-contact sensor on a functional testing platform for workpiece inspection and measurement. By combining two machine platforms into a single machine, this invention provides users with both functional and analytical measurement characteristics, saving considerable cycle time and space.
Career Highlights
Edward J Damron is currently employed at Gleason Metrology Systems Corporation, where he continues to develop cutting-edge technologies in the field of metrology. His work has been instrumental in advancing non-contact measurement techniques.
Collaborations
Damron has collaborated with talented individuals such as Parag Prakash Wagaj and Douglas Charles Beerck, contributing to the success of various projects within his company.
Conclusion
Edward J Damron's innovative work in non-contact sensor technology has made a significant impact on the field of metrology. His patents reflect a commitment to improving measurement systems, ultimately enhancing efficiency and accuracy in various applications.