The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 12, 2025

Filed:

Nov. 16, 2021
Applicant:

Gleason Metrology Systems Corporation, Dayton, OH (US);

Inventors:

Parag Prakash Wagaj, Springboro, OH (US);

Ethan James Shepherd, West Carrollton, OH (US);

Michael R. Tanner, Cincinnati, OH (US);

Edward J. Damron, Waynesville, OH (US);

Douglas Charles Beerck, Dayton, OH (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 11/24 (2006.01); B23F 23/12 (2006.01); G01B 11/00 (2006.01); G01M 13/021 (2019.01);
U.S. Cl.
CPC ...
G01B 11/2416 (2013.01); B23F 23/12 (2013.01); G01B 11/005 (2013.01); G01M 13/021 (2013.01);
Abstract

A multi-axis system () for positioning a workpiece measuring sensor () on a metrology machine. Preferably, each sensor is positionable via a system comprising movement along and/or about at least linear directions/axes (X, Z, A, B) so as to control linear and/or rotational movement of a sensor automatically to a predetermined position without operator intervention. The multi-axis positioning system allows faster setup times when a workpiece or tooling on a machine is changed.


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