The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 01, 2022
Filed:
Oct. 23, 2018
Gleason Metrology Systems Corporation, Dayton, OH (US);
Parag Prakash Wagaj, Springboro, OH (US);
Douglas Charles Beerck, Dayton, OH (US);
Ethan James Shepherd, West Carrollton, OH (US);
Michael R. Tanner, Cincinnati, OH (US);
Edward J. Damron, Waynesville, OH (US);
Aaron Timothy Slusser, Eaton, OH (US);
GLEASON METROLOGY SYSTEMS CORPORATION, Dayton, OH (US);
Abstract
A method and machine comprising at least one non-contact sensor () on a functional testing platform () for workpiece inspection and/or measurement. The inclusion of at least one non-contact sensor on the functional testing platform results in the combination of two machine platforms into a single machine and provides the user with measurement characteristics of both methods, functional and analytical, saving significant cycle time and significant space.