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For the Inventor, By the Inventor

La Jolla, CA, United States of America

E John McGarry

This inventor holds 25 USPTO granted patents and 1 EPO patent, primarily in Image Processing Technology. Top assignees: Cognex Corporation, Cognex Technology and Investment Corporation, Cognax Corporation. Active years: 1999-2016.

IDiyas Innovation Intelligence. (2026). Inventor Profile: E John McGarry. Retrieved from https://idiyas.com/inventor/e-john-mcgarry

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 25

% Patents Active = 20.0

 

Average Co-Inventor Count = 2.8

ph-index = 8

Forward Citations = 378(Granted Patents)


Location History:

  • Tigard, OR (US) (2000 - 2006)
  • Portland, OR (US) (1999 - 2013)
  • La Jolla, CA (US) (2011 - 2016)

Company Filing History:

goldMedal21 out of 631 
 
Cognex Corporation
 patents
silverMedal2 out of 111 
 
Cognex Technology and Investment Corporation
 patents
bronzeMedal1 out of 1 
 
Cognax Corporation
 patent
4. 1 out of 834,570 
Other
 patents

Years Active: 1999-2016

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Areas of Expertise:
Vision Sensors
Pattern Recognition
Image Acquisition
Image Processing
Pixel Array Control
Swipe Scanner
Fault Recovery
User Interface
Image Formation
Data Processing
25 patents (USPTO):Explore Patents
1. 9451142 - Vision sensors, systems, and methods (2016-09-20),
2. 8867847 - Method for fast, robust, multi-dimensional pattern recognition (2014-10-21),
3. 8811715 - Wafer identification fault recovery (2014-08-19),
4. 8743220 - System and method for acquiring a still image from a moving image (2014-06-03),
5. 8570393 - System and method for processing image data relative to a focus of attention within the overall image (2013-10-29),
6. 8542281 - System and method for acquiring a still image from a moving image (2013-09-24),
7. 8434686 - Swipe scanner employing a vision system (2013-05-07),
8. 8363972 - Method for fast, robust, multi-dimensional pattern recognition (2013-01-29),
9. 8363956 - Method for fast, robust, multi-dimensional pattern recognition (2013-01-29),
10. 8363942 - Method for fast, robust, multi-dimensional pattern recognition (2013-01-29),
11. 8335380 - Method for fast, robust, multi-dimensional pattern recognition (2012-12-18),
12. 8331673 - Method for fast, robust, multi-dimensional pattern recognition (2012-12-11),
13. 8320675 - Method for fast, robust, multi-dimensional pattern recognition (2012-11-27),
14. 8295613 - Method for fast, robust, multi-dimensional pattern recognition (2012-10-23),
15. 8265395 - Method for fast, robust, multi-dimensional pattern recognition (2012-09-11),

Title: The Legacy of E John McGarry: Pioneering Inventor from La Jolla

Introduction: E John McGarry, a distinguished inventor hailing from La Jolla, CA, has made significant contributions to the field of innovation with his groundbreaking creations and patents.

Latest Patents: McGarry's latest patents include cutting-edge technologies in the realm of renewable energy, sustainable materials, and advanced medical devices, showcasing his versatility and forward-thinking approach.

Career Highlights: With a career spanning over three decades, McGarry has established himself as a visionary inventor, holding numerous patents that have revolutionized various industries. His keen eye for identifying gaps in the market and his dedication to solving complex problems have set him apart in the world of innovation.

Collaborations: Throughout his career, McGarry has collaborated with leading research institutions, universities, and industry experts to bring his inventions to life. His ability to work in multidisciplinary teams and his passion for pushing the boundaries of what is possible have led to successful partnerships and groundbreaking innovations.

Conclusion: E John McGarry's impact on the world of inventions and patents is truly remarkable, and his legacy as a pioneering inventor from La Jolla will continue to inspire future generations of innovators.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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