The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 21, 2014
Filed:
Oct. 19, 2012
William M. Silver, Nobleboro, ME (US);
E. John Mcgarry, La Jolla, CA (US);
Sanjay Nichani, San Diego, CA (US);
Adam Wagman, Stow, MA (US);
William M. Silver, Nobleboro, ME (US);
E. John McGarry, La Jolla, CA (US);
Sanjay Nichani, San Diego, CA (US);
Adam Wagman, Stow, MA (US);
Cognex Technology and Investment Corporation, Mountain View, CA (US);
Abstract
A method and system for probe-based pattern matching including an apparatus for synthetic training of a model of a pattern. The apparatus comprises a sensor for obtaining an image of the pattern and a processor for receiving the image of the pattern from the sensor and running a program. In the steps performed by the program a boundary of the pattern in the image is identified. A plurality of positive probes are placed at selected points along the boundary of the pattern and at least one straight segment of the boundary of the pattern is identified. The at least one straight segment of the boundary is extended to provide an imaginary straight segment and a plurality of negative probes are placed at selected points along the imaginary straight segment, where each negative probe has a negative weight.