The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 23, 2012
Filed:
Dec. 31, 2004
William M. Silver, Nobleboro, ME (US);
E. John Mcgarry, La Jolla, CA (US);
Sanjay Nichani, San Diego, CA (US);
Adam Wagman, Stow, MA (US);
William M. Silver, Nobleboro, ME (US);
E. John McGarry, La Jolla, CA (US);
Sanjay Nichani, San Diego, CA (US);
Adam Wagman, Stow, MA (US);
Cognex Corporation, Natick, MA (US);
Abstract
Disclosed is a method for determining the absence or presence of one or more instances of a predetermined pattern in an image, and for determining the location of each found instance within a multidimensional space. A model represents the pattern to be found, the model including a plurality of probes. Each probe represents a relative position at which a test is performed in an image at a given pose, each such test contributing evidence that the pattern exists at the pose. The method further includes a comparison of the model with a run-time image at each of a plurality of poses. A match score is computed at each pose to provide a match score surface. Then, the match score is compared with an accept threshold, and used to provide the location any instances of the pattern in the image.