This inventor holds 3 USPTO granted patents. Top assignee: Intel Corporation. Active years: 2004-2021.
Company Filing History:
Years Active: 2004-2021
Title: The Innovations of Donald E. Edenfeld
Introduction
Donald E. Edenfeld is a notable inventor based in Beaverton, Oregon. He has made significant contributions to the field of electronic device testing, holding a total of 3 patents. His work primarily focuses on developing advanced probe technologies that enhance the efficiency and accuracy of electronic testing.
Latest Patents
Edenfeld's latest patents include a "Probe Head and Electronic Device Testing System." This invention features a probe head designed to test electronic devices, incorporating a probe axis and a probe core made of metal. The design allows for precise measurements, with a probe tip extending from the core surface. Another significant patent is for "Probes for Wafer Sorting." This invention outlines systems and methods for manufacturing probes specifically for wafer sorting or die testing, emphasizing the importance of material selection and probe design.
Career Highlights
Edenfeld is currently employed at Intel Corporation, where he continues to innovate in the field of electronic testing. His work has contributed to the advancement of testing technologies, making processes more efficient and reliable. His expertise in probe design has positioned him as a key player in the industry.
Collaborations
Throughout his career, Edenfeld has collaborated with talented individuals such as Todd P. Albertson and John C. Johnson. These collaborations have fostered a creative environment that encourages innovation and the development of cutting-edge technologies.
Conclusion
Donald E. Edenfeld's contributions to electronic device testing through his innovative patents and collaborations highlight his importance in the field. His work continues to influence the industry, paving the way for future advancements in technology.