Company Filing History:
Years Active: 2010-2013
Title: Innovations of Dominique Yon
Introduction
Dominique Yon is an accomplished inventor based in Saint Aubin sur Mer, France. He has made significant contributions to the field of semiconductor technology, holding a total of 2 patents. His work focuses on enhancing the integrity and manufacturing processes of electronic devices.
Latest Patents
One of Dominique Yon's latest patents is titled "Embedded structure for passivation integrity testing." This invention relates to a method and system for testing the integrity of a passivation layer covering a semiconductor device. The method involves depositing a structured layer of electrically conducting material onto a portion of the top surface of the substrate of the semiconductor device. This structured layer comprises a plurality of bands connected to at least two contacts, allowing for effective testing of the passivation layer's integrity based on measured resistance.
Another notable patent is "Electronic device and method for making the same." This invention provides a method for creating a vertical interconnect through a substrate using a sacrificial buried layer. The method allows for the etching of trenches and holes from different sides of the substrate, protecting the trenches during the process. This innovative approach offers several advantages for device manufacturing.
Career Highlights
Dominique Yon has worked with prominent companies in the technology sector, including Ipdia and NXP B.V. His experience in these organizations has contributed to his expertise in semiconductor technology and innovation.
Collaborations
Dominique has collaborated with notable professionals in his field, including Francois Neuilly and David D R Chevrie. These collaborations have further enriched his work and contributions to the industry.
Conclusion
Dominique Yon is a notable inventor whose work in semiconductor technology has led to significant advancements in the field. His patents reflect his innovative approach to solving complex challenges in electronic device manufacturing.