Blacksburg, VA, United States of America

Dilip P Vijay


Average Co-Inventor Count = 3.3

ph-index = 4

Forward Citations = 74(Granted Patents)


Location History:

  • Blacksburg, VA (US) (1996)
  • Fremont, CA (US) (1998)
  • Foster City, CA (US) (2000)

Company Filing History:


Years Active: 1996-2000

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5 patents (USPTO):Explore Patents

Title: Innovations of Dilip P Vijay

Introduction

Dilip P Vijay is a notable inventor based in Blacksburg, VA (US). He has made significant contributions to the field of dynamic random access memories and ferroelectric capacitors. With a total of 5 patents, his work has advanced the technology used in electronic devices.

Latest Patents

One of his latest patents focuses on dynamic random access memories with dielectric compositions that are stable under reducing atmospheres. This charge storage device is designed to resist degradation and consists of a dielectric layer sandwiched between two electrodes, which is grown on a suitable substrate such as silicon. The dielectric layer can be a modified composition of Ba.sub.x Sr.sub.1-x TiO.sub.3, doped with various acceptor type dopants. Another recent patent involves a simple method for fabricating ferroelectric capacitors, which includes a substrate supporting a bottom electrode structure and a ferroelectric material sandwiched between a top electrode.

Career Highlights

Dilip P Vijay has worked with prominent companies such as Sharp Kabushiki Kaisha Corporation and Virginia Tech Intellectual Properties, Inc. His experience in these organizations has contributed to his expertise in the field of electronics and materials science.

Collaborations

He has collaborated with notable colleagues, including Seshu B Desu and Hemanshu D Bhatt, which has further enriched his research and development efforts.

Conclusion

Dilip P Vijay's innovative work in the field of dynamic random access memories and ferroelectric capacitors showcases his significant contributions to technology. His patents reflect a commitment to advancing electronic device performance and reliability.

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