This inventor holds 2 USPTO granted patents. Top assignee: International Business Machines Corporation. Active years: 2024-2026.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2024-2026
Title: Dhruti Nilesh Shah: Innovator in Image Stitching Technology
Introduction
Dhruti Nilesh Shah is a talented inventor based in Chavannes-pres-Renens, Switzerland. She has made significant contributions to the field of image processing, particularly in the area of defect detection for infrastructure surfaces. Her innovative approach has led to the development of a patented method that enhances the accuracy and efficiency of image stitching.
Latest Patents
Dhruti holds a patent for her invention titled "Image stitching for high-resolution scans." This computer-implemented method is designed for stitching together a plurality of digital images of an infrastructure surface to facilitate defect detection. The process involves providing multiple partial digital images, extracting global positioning system meta-data, and determining feature descriptions of the images. By executing a scheduled processing sequence based on the extracted data, the method incrementally positions each partial image to create a comprehensive overview of the infrastructure surface.
Career Highlights
Dhruti is currently employed at International Business Machines Corporation (IBM), where she continues to innovate and develop cutting-edge technologies. Her work has garnered attention for its practical applications in various industries, particularly in infrastructure maintenance and monitoring.
Collaborations
Dhruti collaborates with notable colleagues, including Florian Michael Scheidegger and Adelmo Cristiano Innocenza Malossi. Their combined expertise contributes to the advancement of technology in their respective fields.
Conclusion
Dhruti Nilesh Shah is a pioneering inventor whose work in image stitching technology is making a significant impact in infrastructure defect detection. Her innovative methods and collaborations with esteemed colleagues position her as a key figure in the field of image processing.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
