The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 24, 2024

Filed:

Mar. 15, 2021
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Florian Michael Scheidegger, Dietlikon, CH;

Dhruti Nilesh Shah, Chavannes-pres-Renens, CH;

Adelmo Cristiano Innocenza Malossi, Schönenberg, CH;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 3/4038 (2024.01); G01S 19/01 (2010.01); G06T 7/00 (2017.01); G06T 7/33 (2017.01);
U.S. Cl.
CPC ...
G06T 3/4038 (2013.01); G01S 19/01 (2013.01); G06T 7/0002 (2013.01); G06T 7/33 (2017.01); G06T 2207/10032 (2013.01); G06T 2207/30184 (2013.01);
Abstract

A computer-implemented method is disclosed for image stitching for a plurality of digital images of an infrastructure surface for defect detection. The method includes providing a plurality of partial digital images of an infrastructure surface. The method includes extracting global positioning system meta-data from data corresponding to the partial digital images. The method includes determining feature descriptions of features in the one or more partial digital images. The method includes executing a scheduled processing sequence for the partial digital images based on the extracted global positioning system meta-data including determining an affinity matrix using the feature descriptions of adjacent partial digital images to incrementally position each of the partial digital images such that an overview image of the infrastructure surface is produced by iteratively digitally stitching the plurality of partial digital images together.


Find Patent Forward Citations

Scheidegger, Florian. (2024). Image stitching for high-resolution scans (U.S. Patent No. 12100117). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12100117

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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