The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 17, 2026
Filed:
Feb. 10, 2023
International Business Machines Corporation, Armonk, NY (US);
Florian Michael Scheidegger, Dietlikon, CH;
Dhruti Nilesh Shah, Chavannes-pre-Renens, CH;
Adelmo Cristiano Innocenza Malossi, Schönenberg, CH;
International Business Machines Corporation, Armonk, NY (US);
Abstract
According to embodiments, a method, computer system, and computer program product for obtaining boundaries of structural defects of materials in images of structures is provided. The present invention may include loading an image of a structure made of a material having one or more structural defects and running a pipeline according to certain processing parameters. Running the pipeline pre-processes the loaded image to obtain an initial segmentation mask, where the mask defines an initial boundary of the crack. Based on the initial segmentation mask obtained, a graph of a skeletal structure of the crack is generated, where the skeletal structure comprises a backbone and outer substructures. The graph is pruned by cutting away one or more outer subgraphs corresponding to respective outer substructures to obtain a revised skeletal structure. A revised boundary of the crack is obtained based on both the loaded image and the revised skeletal structure.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile