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Boise, ID, United States of America

Dewali Ray

This inventor holds 8 USPTO granted patents. Top assignee: Micron Technology Incorporated. Active years: 2011-2021.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Dewali Ray. Retrieved from https://idiyas.com/inventor/dewali-ray

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 8

% Patents Active = 100.0

Average Co-Inventor Count = 3.4

ph-index = 3

Forward Citations = 31(Granted Patents)

Company Filing History:

8 out of 39,222

Micron Technology Incorporated

Years Active: 2011-2021

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8 patents (USPTO):Sort by Forward CitationsExplore Patents

1. 11011521 - Semiconductor structure patterning (2021-05-18),

2. 10964475 - Formation of a capacitor using a sacrificial layer (2021-03-30),

3. 10020287 - Pass-through interconnect structure for microelectronic dies and associated systems and methods (2018-07-10),

4. 9209158 - Pass-through 3D interconnect for microelectronic dies and associated systems and methods (2015-12-08),

5. 8929052 - Methods of processing semiconductor substrates, electrostatic carriers for retaining substrates for processing, and assemblies comprising electrostatic carriers having substrates electrostatically bonded thereto (2015-01-06),

6. 8503156 - Methods of processing semiconductor substrates, electrostatic carriers for retaining substrates for processing, and assemblies comprising electrostatic carriers having substrates electrostatically bonded thereto (2013-08-06),

7. 8084854 - Pass-through 3D interconnect for microelectronic dies and associated systems and methods (2011-12-27),

8. 7989022 - Methods of processing substrates, electrostatic carriers for retaining substrates for processing, and assemblies comprising electrostatic carriers having substrates electrostatically bonded thereto (2011-08-02),

I specialize in topics related to innovations, inventions, inventors, patent attorneys, assignees, and patents.

Profile summary based on public USPTO records.

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]

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