For the Inventor, By the Inventor

Enter inventor name

Dallas, TX, United States of America

Dennis Lee Doane

USPTO Granted Patents = 4

Average Co-Inventor Count = 1.7

ph-index = 4

Forward Citations = 60(Granted Patents)

Location History:

Richardson, TX (US) (2000)
Dallas, TX (US) (1995 - 2005)

Company Filing History:

4 out of 29,279

Texas Instruments Corporation

Years Active: 1995-2005

Loading Chart...

4 patents (USPTO):Sort by Forward CitationsExplore Patents

1. 6922483 - Methods for measuring DMD low frequency spatial uniformity (2005-07-26),

2. 6088474 - Inspection system for micromechanical devices (2000-07-11),

3. 5987161 - Apparatus and method for identifying defective objects (1999-11-16),

4. 5457490 - Device and method for acquiring substantially centered images of moving (1995-10-10),

This text is generated by artificial intelligence and may not be accurate.

Please report any incorrect information to support@idiyas.com

Loading…