Dallas, TX, United States of America

Dennis Lee Doane

This inventor holds 4 USPTO granted patents. Top assignee: Texas Instruments Corporation. Active years: 1995-2005.


% Patents Active = 100.0

Average Co-Inventor Count = 1.7

ph-index = 4

Forward Citations = 63(Granted Patents)


Location History:

  • Richardson, TX (US) (2000)
  • Dallas, TX (US) (1995 - 2005)

Company Filing History:


Years Active: 1995-2005

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4 patents (USPTO):Explore Patents

Title: Dennis Lee Doane: Innovator in Micromechanical Device Inspection

Introduction

Dennis Lee Doane is a notable inventor based in Dallas, TX (US). He has made significant contributions to the field of micromechanical devices, holding a total of 4 patents. His work focuses on improving the functionality and inspection processes of these devices, showcasing his innovative spirit and technical expertise.

Latest Patents

One of his latest patents is titled "Methods for measuring DMD low frequency spatial uniformity." This invention provides unique methods for measuring the low spatial reflectivity uniformity of a DMD spatial light modulator. These methods are particularly valuable as they compensate for non-uniformities introduced by the tilt angle of the DMD mirrors, in addition to the typical system non-uniformities caused by the illumination source and optics. By flattening the image, these methods effectively remove all but the low spatial non-uniformities from the DMD mirrors.

Another significant patent is the "Inspection system for micromechanical devices." This invention describes a visual inspection system designed to inspect the operation of micromechanical devices. The system includes a vision system, a vision system controller, a system controller, an illumination system, a digital signal processor, and a mounting stage. Objects undergoing inspection, such as wafers or devices, are mounted under the vision system. A probe card engages with the object, providing power while the vision system records which elements or devices begin operating at that voltage. The voltage is incremented, and the process continues until the operability of the objects is determined. This system can also adapt to inspect micromechanical spatial light modulators by generating images with the modulator and capturing them with the image system.

Career Highlights

Dennis Lee Doane is currently employed at Texas Instruments Corporation, where he continues to innovate and develop new technologies. His work has had a significant impact on the field of micromechanical devices, enhancing their inspection and operational capabilities.

Collaborations

Throughout his career, Dennis has collaborated with notable colleagues, including Charles K Harris and Thomas J Doty. These collaborations have contributed to the advancement of technology in their respective fields.

Conclusion

Dennis Lee Doane is a distinguished inventor whose work in micromechanical devices has led to innovative solutions and patents. His contributions continue to shape the industry, demonstrating the importance of innovation in technology

Profile summary based on public USPTO records.
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