Palo Alto, CA, United States of America

Dean J Kratzer

This inventor holds 2 USPTO granted patents. Top assignee: Photon Dynamics, Inc.. Active years: 1989-1992.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Dean J Kratzer. Retrieved from https://idiyas.com/inventor/dean-j-kratzer

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 2.7

ph-index = 2

Forward Citations = 72(Granted Patents)


Company Filing History:


Years Active: 1989-1992

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2 patents (USPTO):Explore Patents

Title: Dean J. Kratzer: Innovator in Electro-Optic Testing Systems

Introduction

Dean J. Kratzer is a notable inventor based in Palo Alto, CA, who has made significant contributions to the field of electro-optic testing systems. With a total of 2 patents, his work focuses on enhancing the testing capabilities of high-speed electronic devices and integrated circuits.

Latest Patents

Kratzer's latest patents include the "Electro-optic sampling system clock and stimulus pattern generator" and the "Ultra-high-speed digital test system using electro-optic signal sampling." The first patent describes a high-speed electro-optic test system that incorporates a precision programmable reference clock source. This system provides clock pulses that accurately time a stimulus pattern in synchronism with optical sampling pulses. The clock source features a frequency synthesizer with programmed output frequency and precision delay capabilities, allowing for maximum throughput during testing.

The second patent outlines a high-speed test system for semiconductor integrated circuits that utilizes electro-optic sampling techniques. This system can perform tests at data rates of up to 1.2 Gb/s. It includes a receiver with a 4.5 GHz bandwidth and can conduct ECL level functional tests with one sampling pulse per vector. The design minimizes signal path length by positioning a birefringent crystal sensor below the device under test, enhancing the efficiency of the testing process.

Career Highlights

Kratzer is currently employed at Photon Dynamics, Inc., where he continues to innovate in the field of electro-optic testing. His work has significantly advanced the capabilities of testing systems, making them faster and more efficient.

Collaborations

Throughout his career, Kratzer has collaborated with notable colleagues such as Francois G. Henley and Hee-June Choi, contributing to the development of cutting-edge technologies in the industry.

Conclusion

Dean J. Kratzer's contributions to electro-optic testing systems have established him as a key figure in the field. His innovative patents and ongoing work at Photon Dynamics, Inc. continue to push the boundaries of technology in testing high-speed electronic devices.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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