The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 10, 1992
Filed:
Sep. 01, 1988
Applicant:
Inventors:
Francois J Henley, San Jose, CA (US);
Dean J Kratzer, Palo Alto, CA (US);
Assignee:
Photon Dynamics, Inc., San Jose, CA (US);
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R / ;
U.S. Cl.
CPC ...
324 731 ; 3241 / ; 371 27 ;
Abstract
A high-speed electro-optic test system for testing high-speed electronic devices and integrated circuits is provided with a precision programmable reference clock source providing clock pulses for accurately timing a stimulus pattern in precise synchronism with optical sampling pulses. The clock source includes a frequency synthesizer having a programmed output frequency and precision delay features. The stimulus pattern clock frequency and pattern length can be programmed to facilitate maximum throughput for devices being tested in the electro-optic system.