Hsinchu, Taiwan

De Jhong Liao

This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: Taiwan Semiconductor Manufacturing Comp. Ltd.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: De Jhong Liao. Retrieved from https://idiyas.com/inventor/de-jhong-liao

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 1 

Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

Loading Chart...
1 patent (USPTO):Explore Patents

Title: The Innovations of De Jhong Liao

Introduction

De Jhong Liao is a prominent inventor based in Hsinchu, Taiwan. He has made significant contributions to the field of semiconductor technology. His work focuses on methods that enhance the efficiency and effectiveness of semiconductor manufacturing processes.

Latest Patents

One of Liao's notable patents is titled "Method for gap filling with selectively formed seed layer and heteroepitaxial cap layer." This patent describes a method for selectively forming a seed layer over semiconductor fins. The embodiments of this patent provide a technique for forming the selective seed layer using mono-silane at an increased temperature. Additionally, it includes the deposition of a hetero-crystalline silicon cap layer over the bottom-up gap layer to improve gap filling and tune profiles of fin structures. Liao holds 1 patent in this area.

Career Highlights

De Jhong Liao is associated with Taiwan Semiconductor Manufacturing Company Limited, a leading player in the semiconductor industry. His work at this company has allowed him to contribute to advancements in semiconductor manufacturing techniques.

Conclusion

De Jhong Liao's innovative methods in semiconductor technology demonstrate his expertise and commitment to improving manufacturing processes. His contributions are valuable to the ongoing evolution of the semiconductor industry.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…