Company Filing History:
Years Active: 2004
Title: David Wasinger: Innovator in Integrated Circuit Metrology
Introduction
David Wasinger is a notable inventor based in Scottsdale, AZ (US). He has made significant contributions to the field of integrated circuit metrology, particularly through his innovative patent that addresses the challenges of adapting metrology systems to work with diverse devices.
Latest Patents
Wasinger's most recent patent is titled "Metrology diffraction signal adaptation for tool-to-tool matching." This patent presents a method and system designed to enhance integrated circuit metrology by adapting a metrology system to function effectively with various metrology devices. One embodiment of this invention involves generating signal adjustment data to adapt measured diffraction signals, enabling the use of a library of diffraction signals and structure profiles created for a different metrology device. Additionally, another embodiment focuses on the creation and utilization of a data store containing diffraction adjustment vectors and metrology device specifications relative to a reference device specification. This innovative approach has the potential to streamline processes in the semiconductor industry.
Career Highlights
David Wasinger is currently employed at Timbre Technologies, Inc., where he continues to develop and refine technologies that enhance metrology practices. His work has positioned him as a key player in the field, contributing to advancements that improve the accuracy and efficiency of integrated circuit manufacturing.
Collaborations
Wasinger collaborates with talented professionals in his field, including Michael Laughery and Nickhil Jakatdar. These partnerships foster an environment of innovation and creativity, allowing for the exchange of ideas and expertise.
Conclusion
David Wasinger is a distinguished inventor whose work in integrated circuit metrology has led to significant advancements in the industry. His innovative patent demonstrates his commitment to improving metrology systems and enhancing the capabilities of diverse metrology devices.