Boise, ID, United States of America

David W Overgaard

USPTO Granted Patents = 1 

Average Co-Inventor Count = 6.0

ph-index = 1


Company Filing History:


Years Active: 2025

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1 patent (USPTO):Explore Patents

Title: David W Overgaard: Innovator in Memory Device Testing

Introduction

David W Overgaard is a notable inventor based in Boise, ID (US). He has made significant contributions to the field of memory devices, particularly in the area of on-die testing. His innovative approach has the potential to enhance the reliability and performance of memory technologies.

Latest Patents

David W Overgaard holds a patent for "On-die testing for a memory device." This patent describes methods, systems, and devices designed for on-die testing of memory devices. The memory die includes processing circuitry that performs evaluations based on commands from an external device. This circuitry can detect failures and transmit indications to the external device. Notably, it can communicate failure information with greater detail than what is typically associated with expected behavior. Additionally, the processing circuitry can operate on an internally-generated clock signal that is faster than the external device's clock signal. It may also include analog-to-digital conversion capabilities for digital communication of internal analog characteristics.

Career Highlights

David W Overgaard is currently employed at Micron Technology Incorporated, a leading company in the semiconductor industry. His work focuses on advancing memory technology through innovative testing methods. His contributions have been instrumental in improving the efficiency and effectiveness of memory devices.

Collaborations

David has collaborated with notable colleagues such as Andrew P Lyle and Glen Earl Hush. These collaborations have fostered a creative environment that encourages innovation and the development of cutting-edge technologies.

Conclusion

David W Overgaard is a prominent figure in the field of memory device innovation. His patent for on-die testing exemplifies his commitment to enhancing technology in this area. His work at Micron Technology Incorporated and collaborations with esteemed colleagues further highlight his impact on the industry.

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