David Trease

Title: **David Trease: Innovator in Electron Microscopy**

Introduction

David Trease, an accomplished inventor based in Milpitas, CA, has made significant contributions to the field of electron microscopy. With a total of five patents to his name, Trease's work focuses on advancing the technology and methodologies used in high-precision imaging and inspection systems.

Latest Patents

Among his latest innovations, Trease has developed the "Method and system for charged particle microscopy with improved image beam stabilization and interrogation." This cutting-edge scanning electron microscopy system features an electron beam source that generates an electron beam, directing it through a set of electron-optical elements onto a sample. The system also includes an emittance analyzer assembly and a splitter element to direct secondary electrons and backscattered electrons to the analyzer for imaging.

Another notable patent is the "Method and system for edge-of-wafer inspection and review." This invention encompasses an electron-optical system specifically designed to inspect the edge portion of a sample. It comprises an electron beam source, a sample stage for securing the sample, and a sophisticated electron-optical column. The system includes a sample position reference device and a guard ring device, which allows for adjustable characteristics, ensuring accurate detection of electrons emanating from the sample surface.

Career Highlights

David Trease has had an impressive career, working with notable organizations such as Kla Tencor Corporation and Kla Corporation. His roles in these companies have underscored his expertise in the electron microscopy field, enabling him to drive forward innovative solutions that enhance imaging processes.

Collaborations

Throughout his career, Trease has had the opportunity to work alongside talented professionals like Christopher Sears and Xinrong Jiang. These collaborations have facilitated the development of groundbreaking technologies within the field, as they combine their strengths and knowledge to advance the discipline.

Conclusion

David Trease stands as a prominent figure in the invention of advanced electron microscopy systems. His patents reflect a commitment to enhancing imaging capabilities and the precision involved in sample inspection. With significant contributions to the industry, Trease's work continues to influence research and technological advancements in electron microscopy.