David S Koos

Title: Innovations by David S. Koos

Introduction

David S. Koos is an accomplished inventor based in Pasadena, CA. He has made significant contributions to the field of microscopy, holding a total of 3 patents. His work focuses on developing advanced imaging techniques that enhance research capabilities.

Latest Patents

One of his latest patents is for a device that enables simultaneous orthogonal light sheet microscopy and computed optical tomography. This innovative apparatus allows researchers to perform both orthogonal light sheet microscopy (OLM) and computer optical tomography (COT) in a single instrument. The dual-mode imaging microscope provides access to a wider selection of samples and improves imaging results. Additionally, it reduces the high costs and space requirements associated with owning separate devices for OLM and COT.

Another notable patent is for a dual-mode raster point scanning/light sheet illumination microscope. This device allows for the use of both light sheet microscopy (LISH) and light scanning microscopy (RAPS) in one instrument. Similar to his previous invention, this dual-mode microscope enables researchers to access a broader range of samples while minimizing costs and space needs.

Career Highlights

David S. Koos is affiliated with the California Institute of Technology, where he continues to push the boundaries of microscopy technology. His work has garnered attention for its potential to revolutionize imaging techniques in various research fields.

Collaborations

Throughout his career, David has collaborated with notable colleagues, including Thai Viet Truong and John M. Choi. These partnerships have contributed to the advancement of his innovative projects.

Conclusion

David S. Koos is a prominent inventor whose work in microscopy has led to significant advancements in imaging technology. His patents reflect a commitment to improving research methodologies and reducing costs for scientists.